About the LAC
The Jodon Louver Angle Measurement System, Model LAC-2000, is a standalone, offline system for measuring louver features of convolution (serpentine) and plate types cooling fins. Defects in fin fabricating tooling and fin machine alignment can be easily identified and analyzed using this system.
Long-term degradation in fin machine rolls (or dies), caused by age or misalignment, can be tracked using the “percent bulk transmission” feature. Daily use of the LAC-2000 permits operators to determine when adjustments or changes should be made in order to ensure continued production of conforming louvered fin components.
A single LAC system can be used to qualify one, or dozens of production fin mills. Dedicated fin holding fixtures, and preprogrammed instructions and computer routines ensure simplicity of operation and preciseness of measurements.
The LAC-2000 saves measurement results for presentation of text reports, and for use in Statistical Process Control (SPC) analysis and graphical presentation. Accordingly, current or historical fin production can be viewed within the LAC program.
Percent Bulk Transmission (%BT)
When performing measurements, the LAC-2000 compares the amplitude of light passing through each louvered window at the angle of maximum intensity to the light amplitude which would pass though the louvered window if the panel was formed exactly to print. This ratio is called Percent Bulk Transmission (%BT). With increasing wear or misalignment of the fin tooling, the %BT measurements will drop as well.
Statistical Process Control (SPC)
Statistical Process Control (SPC) is a method of quality control which employs statistical methods to monitor and control a process. This helps to ensure that the process operates efficiently and produces more specification-conforming products with less waste.
The LAC-2000 software stores test results for use in text reports and SPC analysis and presentations. SPC data can be viewed for Louver Angle as well as % Bulk Transmission in the form of Control Charts, Trend Charts, and a variety of Histograms.